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透射电子显微镜在本科教学中的应用探索
引用本文:孙婧婧,陈莹,廉冀琼,孙东亚,许彬彬,雷彩霞.透射电子显微镜在本科教学中的应用探索[J].教育教学论坛,2020(16):150-151.
作者姓名:孙婧婧  陈莹  廉冀琼  孙东亚  许彬彬  雷彩霞
作者单位:厦门理工学院;厦门大学;广西大学
基金项目:国家自然科学基金青年科学基金项目,(51601162);福建省教育厅中青年教师教育科研项目,(JT180423);厦门理工学院2018年教育教学改革项目(JG2018010)。
摘    要:透射电子显微镜(TEM)由于其高分辨率及精细的结构分析,广泛应用于纳米材料等新材料的分析研究,是材料分析测试的一种重要方法,也是材料类学生在今后的工作、科研中应掌握的一门必备技术。但由于其理论要求较高、价格昂贵、设备资源稀少,主要用于教师科研工作,很少发挥其在本科教学中的作用。为提升高校分析测试技术课程的教学效果,通过综合分析TEM在本科教学中存在的问题,从理论知识学习到实践操作指导及最后的激励考核机制进行了一系列的探索,有效发挥其在本科教学中的作用,起到为科研服务的同时有效地提升本科教学水平的作用。

关 键 词:透射电子显微镜(TEM)  材料测试  本科教学

ApplicationResearch on Transmission Electron Microscope in Undergraduate Experiment Teaching
SUN Jing-jing,CHEN Ying,LIAN Ji-qionog,SUN Dong-ya,XU Bin-bin,LEI Cai-xia.ApplicationResearch on Transmission Electron Microscope in Undergraduate Experiment Teaching[J].jiaoyu jiaoxue luntan,2020(16):150-151.
Authors:SUN Jing-jing  CHEN Ying  LIAN Ji-qionog  SUN Dong-ya  XU Bin-bin  LEI Cai-xia
Institution:(Xiamen University of Technology,Xiamen,Fujian 361002,China;Xiamen University,Xiamen,Fujian 361002,China;Guangxi University,Nanning,Guangxi 530000,China)
Abstract:Because of its high resolution and fine structure analysis,Transmission Electron Microscopy(TEM)is widely used in the analysis and research of nanomaterial,It is unimportant method for Material analysis and an essential skill for the student in future research and work.Because of its high theoretical requirement,high price and scarcity of equipment resources,it is mainly used in research work and seldom playing role in undergraduate teaching.In order to improve the teaching effect of the course of Analytical Testing Technology in Colleges and universities,We comprehensively analysis of the problems of TEM in undergraduate teaching,a series of explorations have been carried out from theoretical knowledge learning to practical operation guidance and the final incentive and assessment mechanism,which can effectively play its role in undergraduate teaching and improve the undergraduate teaching level while serving for scientific research.
Keywords:transmission electron microscope  material test  undergraduate teaching
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