| 新型数字IC测试仪的设计 |
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| 引用本文： | 余波,李维,吴兆耀.新型数字IC测试仪的设计[J].四川教育学院学报,2013,29(7):122-124. |
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| 作者姓名： | 余波 李维 吴兆耀 |
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| 作者单位： | 成都师范学院物理与电子技术系,成都,611130 |
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| 基金项目： | 四川教育学院2011年院级重点项目 |
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| 摘 要： | 在测试74LS系列IC的过程中,为解决插拔被测IC时测试插座带电的问题,设计了一种由两片单片机组成、上位机为下位机程控供电的新型数字IC测试仪,该测试仪实现了插拔被测IC时测试插座完全断电,并具有时钟和温度显示等辅助功能。
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| 关 键 词： | IC 测试仪 单片机 程控供电 损坏 |
Design of a New Kind of Digital IC Tester |
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| YU Bo
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Li Wei
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WU Zhao-yao.Design of a New Kind of Digital IC Tester[J].Journal of Sichuan College of Education,2013,29(7):122-124. |
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| Authors: | YU Bo Li Wei WU Zhao-yao |
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| Institution: | ( Department of Physics and Electronic Technology, Chengdu Normal University, Chengdu 611130, China) |
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| Abstract: | In order to solve the problem of the plug measured IC test sockets charged , in the process of testing 74LS series IC, a new kind of digital IC tester has been designed. It consists of two MCU, and host - computer controls the power supply of lower system. The test instrument plug measured IC test socket is completely powered off, and the tester has the auxiliary function that includes clock and temperature display etc. |
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| Keywords: | tester single - chip microcomputer programmable power supply damage |
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