| 纯铁膜的阻温特性 |
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| 引用本文： | 陈卫平,崔巧文,邵先亦.纯铁膜的阻温特性[J].台州学院学报,2003,25(6):29-31. |
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| 作者姓名： | 陈卫平 崔巧文 邵先亦 |
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| 作者单位： | 台州学院信息与电子工程学院物理系,浙江,临海,317000 |
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| 摘 要： | 采用直流磁控溅射的方法 ,制备了一系列不同厚度的纯铁膜 ,并测量了它们的阻温 (R -T)特性。研究表明 ,样品的R -T特性与镀膜时间 ,即膜的厚度有关。在同一系列中 ,随样品厚度的增加 ,R -T关系呈现出由半导体特性向金属性渡越的特征
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| 关 键 词： | 纯铁膜 金属性 半导体性 临界厚度 |
| 文章编号： | 1672-3708(2003)06-0029-03 |
| 修稿时间： | 2003年7月25日 |
Temperature- resistance Properties of the Pure Ferric Film |
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| CHEN Wei-ping,CUI Qiao-wen,SHAO Xian-yi.Temperature- resistance Properties of the Pure Ferric Film[J].Journal of Taizhou University,2003,25(6):29-31. |
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| Authors: | CHEN Wei-ping CUI Qiao-wen SHAO Xian-yi |
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| Abstract: | Series of pure ferric films are prepared by the magnetron-control sputtering method, and their temperature-resistance properties are measured. Studies have shown that the temperature-resistance properties of the samples are related to the thickness of the pure ferric films. Within the same series of pure ferric films, the temperature-resistance relationship has shown the tendency of transition from semiconductor characteristics to metallic characteristics. |
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| Keywords: | pure ferric film metallic characteristics semiconductor characteristics thickness of the adjacent part |
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