首页 | 本学科首页   官方微博 | 高级检索  
     检索      

Measurement of sugar content in Fuji apples by FT-NIR spectroscopy
作者姓名:刘燕德  应义斌
基金项目:Project (No. 30270763) supported by the National Natural Science Foundation of China
摘    要:INTRODUCTION Recently increasing demands from consumerhave been observed for premium quality fruit witbetter taste at a higher price. Three major parameters determine the internal quality and the tastof apples. These are hardness, sugar content antitratable acidity, which are still determined destructively. Near-infrared spectroscopy (NIRS) habeen used to nondestructively measure internquality in a wide range of fruits and vegetablesuch as onions (Birth et al., 1985), cantaloupe (…


Measurement of sugar content in Fuji apples by FT-NIR spectroscopy
LIU Yan-de ,YING Yi-bin.Measurement of sugar content in Fuji apples by FT-NIR spectroscopy[J].Journal of Zhejiang University Science,2004(6).
Authors:LIU Yan-de    YING Yi-bin
Institution:LIU Yan-de 1,2,YING Yi-bin 1
Abstract:To evaluate the potential of FT-NIR spectroscopy and the influence of the distance between the light source/detection probe and the fruit for measuring the sugar content (SC) of Fuji apples, diffuse reflectance spectra were measured in the spectral range from 12500 to 4000 cm?1 at 0 mm, 2 mm, 4 mm and 6 mm distances. Four calibration models at four distances were established between diffused reflectance spectra and sugar content by partial least squares (PLS) analysis. The correlation coefficients (R) of calibrations ranged from 0.982 to 0.997 with SEC values from 0.138 to 0.453 and the SECV values from 0.74 to 1.58. The best model of original spectra at 0 mm distance yielded high correlation de- termination of 0.918, a SEC of 0.092, and a SEP of 0.773. The results showed that different light/detection probe-fruit distances influence the apple reflective spectra and SC predictions.
Keywords:FT-NIR spectroscopy  Nondestructive measurement  Sugar content  Fuji apples  Partial least squares analysis
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号