| Er掺杂ZnO薄膜光学特性的研究 |
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| 引用本文： | 徐井华,崔舒,刘成有.Er掺杂ZnO薄膜光学特性的研究[J].通化师范学院学报,2011,32(6):32-33. |
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| 作者姓名： | 徐井华 崔舒 刘成有 |
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| 作者单位： | 通化师范学院物理系,吉林通化,134002 |
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| 基金项目： | 通化师范学院自然科学科研项目(NO.201051) |
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| 摘 要： | 采用溶胶凝胶工艺,分别在普通载玻片和Si片上生长了不同浓度的Er掺杂ZnO薄膜,稀土Er3＋与Zn2＋的摩尔比分别为1%、2%、3%,所得薄膜采用X射线衍射仪（XRD）、原子力显微镜（AFM）、紫外可见分光光度计（UVS）、光致荧光光谱（PL）对样品的结构、形貌和发光进行表征.结果表明掺杂后的样品仍为六角纤锌矿结构,随着掺杂浓度提高,掺杂样品的XRD衍射峰向大角方向微移,透射边向短波方向微移,紫外发光峰的强度逐渐增强,表面均呈颗粒状且尺寸逐渐减小.
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| 关 键 词： | Er掺杂 ZnO薄膜 发光特性 表面形貌 |
Optical Property of Er-doped ZnO Thin Films |
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| XU Jing-hua,CUI Shu,LIU Cheng-you.Optical Property of Er-doped ZnO Thin Films[J].Journal of Tonghua Teachers College,2011,32(6):32-33. |
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| Authors: | XU Jing-hua CUI Shu LIU Cheng-you |
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| Institution: | XU Jing-hua,CUI Shu,LIU Cheng-you(Department of Physics,Tonghua Normal University,Tonghua,Jilin 134002,China) |
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| Abstract: | In this paper,Er-doped ZnO thin films were deposited on the substrates of slide and Si by sol-gel method.The Er3+/Zn2+ ratio were 1%,2%,3%,All the samples were characterized by X-ray diffraction(XRD),atomic force microscope(AFM),ultra-violet spectrometer(UVS) and photoluminescence(PL).Er-doped ZnO films were found that doped samples were still hexagonal wurtzite structure.As the doping concentration increased,XRD diffraction peaks shifted significantly to large angle,the transmission side had blue shift and... |
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| Keywords: | Er-doped ZnO thin film luminescence property surface morphology |
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