| CMOS图像传感器中A/D转换器的可测性设计 |
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| 引用本文： | 裴志军,曹继华.CMOS图像传感器中A/D转换器的可测性设计[J].天津工程师范学院学报,2004,14(3):13-16. |
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| 作者姓名： | 裴志军 曹继华 |
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| 作者单位： | 天津工程师范学院电子工程系,天津,300222 |
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| 摘 要： | 模拟或混合集成电路设计过程早期 ,应充分考虑电路的可测性。CMOS图像传感器系统集成A/D转换器设计中 ,每级 1.5位结构流水线A/D转换器适合于高分辨率、高速应用 ,同时具有良好的可测性。另外 ,位串行A/D转换器结构也具有较好的可测性 ,可应用于CMOS图像传感器系统
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| 关 键 词： | CMOS图像传感器 A/D转换器 可测性设计 |
| 文章编号： | 1008-5718(2004)03-0013-04 |
| 修稿时间： | 2004年3月30日 |
Design for testability of analog-to-digital convention in CMOS imaging sensors |
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| PEI Zhi-jun,CAO Ji-hua.Design for testability of analog-to-digital convention in CMOS imaging sensors[J].Journal of Tianji University of Technology and Education,2004,14(3):13-16. |
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| Authors: | PEI Zhi-jun CAO Ji-hua |
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| Abstract: | Design for testability should be considered in the early process of the analog or mixed integrated circuits design cycles. In the design of A/D convention for CMOS imaging sensors, pipeline analog-to-digital convention with 1.5 bits per stage provided in the paper has well testability, high decision and high rate application as well. Bit serial analog-to-digital convention also has high testability and can be used in the CMOS imaging sensors. |
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| Keywords: | CMOS imaging sensors analog-to-digital convention design for testability |
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