| 一种SEU／SET加固SAFF设计 |
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| 引用本文： | 段健.一种SEU／SET加固SAFF设计[J].西安文理学院学报,2011(3):80-82. |
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| 作者姓名： | 段健 |
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| 作者单位： | 西安工程机械专修学院机械电子工程系,陕西杨凌712100 |
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| 摘 要： | 单粒子翻转（SEU）和单粒子瞬态脉冲效应（SET）是引起数字逻辑电路发生错误的重要原因．针对SAFF触发器电路设计了一种抗SEU／SET加固电路，该电路由一个基于敏感放大器的主级，四个门保护电路组成的中间级和一个SR锁存器的从级组成．仿真结果表明该结构具有良好的抗SEU／SET性能．
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| 关 键 词： | 单粒子翻转 单粒子瞬态脉冲效应 SAFF |
Mitigating SEU/SET from SAFF |
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| DUAN Jian.Mitigating SEU/SET from SAFF[J].Journal of Xi‘an University of Arts & Science:Natural Science Edition,2011(3):80-82. |
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| Authors: | DUAN Jian |
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| Institution: | DUAN Jian ( Department of Mechanical and Electronic Engineering , Xi＇ an Construction Machinery Training College, Yangling 712100, China) |
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| Abstract: | Soft errors may be caused by Single Event Upset （ SEU ） and Single Event Transient effects （SET ） in digital logic circuits. This paper proposed an SAFF flip -flop circuit mitigating SEU/SET, which consists of a sense - amplifier based main stage, a four gates middle - class protection circuit and a SR latch from the the structure has good resistance to SEU / SET class composition. Simulation results show that performance. |
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| Keywords: | single event upset single event transient effects SAFF |
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