首页 | 本学科首页   官方微博 | 高级检索  
     检索      

正常新生儿颅脑多排螺旋CT测量
引用本文:张薇.正常新生儿颅脑多排螺旋CT测量[J].德州学院学报,2012,28(4):64-67.
作者姓名:张薇
作者单位:德州学院医学系,山东德州,253023
摘    要:目录:应用MSCT(多排螺旋CT,multi-slice computed tomography)测量正常新生儿的脑室结构和脑容积,为新生儿脑发育状况评价及颅脑疾病诊断提供CT解剖数据.方法:从进行颅脑CT扫描的新生儿中选取43例无异常发现者的CT图像进行测量,首先在CT机上选择测量距离值示标,分别测量侧脑室前角最大距离等7项指标,每个指标均测量三次,取其均值,并计算脑室指数;利用容积测量软件,用等灰度法均匀涂布所选区域,测量脑容积等9项指标.结果:获得正常新生儿脑室结构CT测量指标平均值和新生儿脑容积9项指标的平均值,且左右小脑半球容积及左右侧脑室容积差异无显著性(P均>0.05).结论:MSCT可准确可靠地测量正常活体新生儿脑室结构和脑容积,从影像学角度认识正常新生儿颅脑的CT解剖.

关 键 词:新生儿  脑容积  体层摄影术  X线计算机  摄影测量法

The Measurement of the Brain with MSCT in the Normal Neonates
ZHANG Wei.The Measurement of the Brain with MSCT in the Normal Neonates[J].Journal of Dezhou University,2012,28(4):64-67.
Authors:ZHANG Wei
Institution:ZHANG Wei(Department of Medicine,Dezhou University,Dezhou Shangdong 253023,China)
Abstract:Objective: To observe ventricle structure and brain volume of the normal newborn with MSCT and to supply objective CT data of the normal anatomy for diagnosis various neonatal brain disease and to value neonatal brain development.Methods: The normal head CT imagings of 43 neonates were chosen.The mean values of senven items of ventricle structure were abtained with two-dimensional imaging technology.The gray-scale method was used to coat the selected area by the software of brain volume measurement and to measure nine items of the brain volume.Results: The mean values of senven items of ventricle structure and the mean values of nine items of neonates were obtained,and there were no statistical significant differences in comparison between the volume of the left and right cerebral hemisphere,the left and right cerebellar hemisphere,the left and right lateral ventricle(P>0.05).Conclusion: MSCT can be accurate and reliable in vivo measurement of the normal neonatal ventricle structure and brain volume,so it can recog the CT anatomy of the brain volume of normal neonatal from the perspective of imaging.
Keywords:neonatal  brain volume  tomography  X-ray computed  photogrammetry
本文献已被 CNKI 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号