| Random-Like Testing of Very Large Scale Integration Circuit |
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| 作者姓名： | Xu Shiyi |
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| 摘 要： | ｅｇｒａｔｉｏｎ ＣｉｒｃｕｉｔTX１ＩｎｔｒｏｄｕｃｔｉｏｎＯｆａｌｔｈｅｔｅｓｔｇｅｎｅｒａｔｉｏｎａｌｇｏｒｉｔｈｍｓ，ｒａｎｄｏｍｔｅｓｔ－ｉｎｇｉｓａｎｅｆｉｃｉｅｎｔａｎｄｃｏｓｔ－ｅｆｅｃｔｉｖｅｔｅｓｔｍｅｔｈｏｄｆｏｒｐｒｏｄｕｃｔｉ...
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| 收稿时间： | 23 March 1998 |
Random-like testing of very large scale integration circuit |
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| Xu Shiyi.Random-Like Testing of Very Large Scale Integration Circuit[J].Journal of Shanghai University(English Edition),1998,2(4):279-283. |
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| Authors: | Shiyi Xu |
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| Institution: | School of Computer Engineering and Science |
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| Abstract: | A new approach to improve the test efficiency of random testing is presented in this paper. In conventional random testing, each test pattern is selected randomly regardless of the tests previously generated. This paper introduces the concept of random like testing. The method provided appears to have the same concepts as used in random testing,but actually takes an opposite way to it in order to improve the efficiency of random testing.In a random like testing sequence, the total distance among all test patterns is chosen to be maximal so that the fault sets detected by one test pattern are as different as possible from that detected by the tests previously applied. The procedure to construct a random like testing sequence (RLTS) is described in detail. Theorems to justify the effectiveness and usefulness of the procedure presented are developed. Experimental results on benchmark circuits as well as on other circuit are also given to evaluate the performance of the new approach. |
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| Keywords: | random testing fault coverage Hamming distance total Hamming distance |
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