| 离子轰击引起的场致发射体发射电流跌落的研究 |
| |
| 引用本文： | 姚建楠,李俊涛.离子轰击引起的场致发射体发射电流跌落的研究[J].东南大学学报,2002,18(4). |
| |
| 作者姓名： | 姚建楠 李俊涛 |
| |
| 作者单位： | [1]东南大学电子工程系 [2]东南大学电子工程系 南京 |
| |
| 基金项目： | TheprojectsupportedbytheFoundationofNationalDefenseScienceandTechnologyHighPowerMicrowaveElectronicVacuumDeviceKeyLaboratory
(5 14 40 0 40 10 1JW0 60 1) |
| |
| 摘 要： | 在场致发射器件中 ,发射电流通常会随着工作时间的增加而跌落 .发射电流跌落的机理较为复杂 .本文模拟分析了一次电子从场致发射发射体表面的发射情况 .根据一次电子的电流密度分布和运动轨迹 ,研究残余气体分子的电离 .然后计算正离子在电场中的运动轨迹 ,利用半经验模型分析不同能量的正离子对发射体表面的损伤情况 ,最后估计出在不同残余气压和一次电流下发射电流的衰减
|
| 关 键 词： | 场致发射体 发射电流跌落 离子轰击 |
Degradation of the Emission Current from the Field Emitter Caused by Ion Bombardment |
| |
| Yao Jiannan,Li Juntao.Degradation of the Emission Current from the Field Emitter Caused by Ion Bombardment[J].Journal of Southeast University(English Edition),2002,18(4). |
| |
| Authors: | Yao Jiannan Li Juntao |
| |
| Abstract: | In field emission devices, the emission current sometimes degrades with the time. The mechanism of the current degradation is complicated. In this paper, a program is used to simulate the movement of the electron beam from a field emitter. According to the current distribution and the trajectories of the primary electron beam, it is shown that the residual gas is ionized and the ion pairs are generated. The trajectories of the positive ions are simulated. With the different locations and kinetic energy of ions, the damage of the emitter surface is analysed and the variation of the profile of the field emitter is obtained. Finally, the degradation of the emission current is predicted with different gas pressures and primary electron beam current. |
| |
| Keywords: | field emitter degradation of the emission current ion bombardment |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
