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Patent citation inflation: The phenomenon,its measurement,and relative indicators to temper its effects
Institution:1. School of Information Management, Wuhan University, China;2. Centre for R&D Monitoring (ECOOM) and Department of MSI, KU Leuven, Belgium;3. School of Information Technology, Shangqiu Normal University, China;1. College of Liberal Arts and Sciences, National University of Defense Technology, Changsha, China;2. Department of Mathematics, University of California, Los Angeles, USA;1. Department of Information Management, Nanjing University of Science and Technology, Nanjing, China;2. Department of Network and New Media, Nanjing Normal University, Nanjing, China;1. Center for Modern Korean Studies, Yonsei University, Wonju, Republic of Korea;2. Department of Library and Information Science, Yonsei University, Seoul, Republic of Korea;3. College of Computing and Informatics, Drexel University, Philadelphia, USA;1. University of Hasselt, Belgium;2. University of Antwerp, Faculty of Social Sciences, B-2020, Antwerpen, Belgium;3. Centre for R&D Monitoring (ECOOM) and Dept. MSI, KU Leuven, Leuven, Belgium
Abstract:In recent decades, the United States Patent and Trademark Office (USPTO) has been granting more and more patents with more and more references, which has led to patent citation inflation. Citation counts are a fundamental consideration in decisions about research funding, academic promotions, commercializing IP, investing in technologies, etc. With so much at stake, we must be sure we are valuing citations at their true worth. In this article, we reveal two types of patent citation inflation and analyze its causes and cumulative effects. Further, we propose some alternative indicators that more accurately reflect the true worth of a citation. A case study on the patents held by eight universities demonstrates that the relative indicators outlined in this paper are an effective way to account for citation inflation as an alternative approach to evaluating patent activity.
Keywords:Citation inflation  Patent obsolescence  Relative citation indicator  Reference share  Research evaluation
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