| 支术监测和专利情报分析的理论和方法 |
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| 引用本文： | 韩红旗,张嶷.支术监测和专利情报分析的理论和方法[J].数字图书馆论坛,2009(10):3-13. |
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| 作者姓名： | 韩红旗 张嶷 |
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| 作者单位： | 1. 北京理工大学管理与经济学院,北京,100081
2. 北京理工大学知识管理与数据分析实验室,北京,100081 |
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| 摘 要： | 技术监测可以从互联网、科技文献、专利等数据中获取有价值的技术情报信息，是一种有效的科研管理、技术创新和技术评估方法。专利是一种重要的技术监测对象，包含了大量的技术情报信息。对技术监测的概念，对象和技术方法进行了总结；以专利情报的分析为例说明了技术监测的使用方法。
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| 关 键 词： | 技术监测 专利情报分析 技和情报 |
Theory and Methodology of Technology Monitoring and Patent Intelligence Analysis |
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| Han Hongqi,Zhang Yi.Theory and Methodology of Technology Monitoring and Patent Intelligence Analysis[J].Digital Library Forum,2009(10):3-13. |
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| Authors: | Han Hongqi Zhang Yi |
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| Institution: | ( School of Management and Economics, Beijing Institute of Technology, Beijing, 100081; Laboratory of Knowledge Management and Data Analysis, Beijing Institute of Technology, Beijing, 100081) |
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| Abstract: | Technology monitoring, which can be used to obtain valuable technology intelligence from Intemet, technological literatures and patent documents, is an effective method in scientific research management, technology innovation and technology assessment. As an important technology monitoring object, patent documents embody mass technology intelligence. The paper first examines the concept, objects and methods of technology monitoring, then takes patent as an example to illuslrate the technology methods. |
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| Keywords: | Technology monitoring Patent intelligence analysis Technology intelligence |
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