| 利用Innography进行专利情报分析——以OLED为例 |
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| 引用本文： | 战玉华,潘乐影,程爱平.利用Innography进行专利情报分析——以OLED为例[J].图书情报工作,2013,57(18):104-109. |
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| 作者姓名： | 战玉华 潘乐影 程爱平 |
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| 作者单位： | 清华大学图书馆 |
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| 摘 要： | 指出作为众多专利分析工具中的一种,Innography具有专利检索、统计分析及核心专利挖掘等功能。以典型课题有机发光二极管(OLED)为例,探索Innography在专业情报分析中的价值,阐述如何利用Innography获取全球专利信息,利用专利强度指标挖掘核心专利,对相关专利进行统计分析,得出科学的结论。总结Innography的特点及不足,强调专利情报分析必须准确和全面。
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| 关 键 词： | 专利分析 Innography 有机发光二极管 OLED |
| 收稿时间： | 2013-04-19 |
Patents Analysis by Innography：Taking OLED as an Example |
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| Zhan Yuhua,Pan Leying,Cheng Aiping.Patents Analysis by Innography：Taking OLED as an Example[J].Library and Information Service,2013,57(18):104-109. |
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| Authors: | Zhan Yuhua Pan Leying Cheng Aiping |
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| Institution: | Tsinghua University Library, Beijing 100084 |
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| Abstract: | Patents are important literatures for scientific research and information analysis. As one of patent analysis tools, Innography has many functions such as patent retrieval, patent analysis and core patent digging. Taking organic light-emitting diode (OLED) as an example, this paper explores the value of Innography in professional information analysis and illustrates how to obtain global patents, dig core patents by patent strength index and make scientific conclusions by analysis with Innography. This paper finally summarizes the characteristics and shortcomings of Innography, emphasizing that patent analysis must be accurate and comprehensive. |
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| Keywords: | patent analysis Innography organic light-emitting diode OLED |
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