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1.
RejectionofNarowBandInterferenceinDSSpreadSpectrumSystemsUsingRecurentNeuralNetworksYouXiaohu(尤肖虎)FuLi(傅莉)(NationalCommunic...  相似文献   

2.
StudyonAutomatedAssemblyProcessPlanningfortheSpindleBoxofNCLatheYiHong(易红)TangWencheng(汤文成)ShiJun(石均)(DepartmentofMechanical...  相似文献   

3.
PrecisionandVelocityofSimulatingMandelbrotSetShengZhaohan(盛昭瀚)ZhaoLindu(赵林度)LiuShijun(刘世军)(SchoolofEconomicsandManagement,Sou...  相似文献   

4.
小说中人物话语的表现方式(SpeechPresentation)可分为以下五类:1、直接引语(directspeech简称DS)。2、间接引语(indirectspeechIS)。3、自由直接引语(freedirectspeechFDS)。4、自由间接引语(freeindirectspeechFIS)。5、人物说话的叙述性报道(narrativereportofspeechactsNRSA)。作者运用这几种不同的表现方法来呈现人物的语言和思想。本文就自由直接引语的特征及其在小说中的运用进行探讨。…  相似文献   

5.
DynamicGraphicalSimulationofaLargeScaleMotorCraneChassisChenYunfeia(陈云飞)HuangXishib(黄锡时)XuShangxiana(许尚贤)(aDepartmentofMechan...  相似文献   

6.
TextandVoiceIntegratedPagingSystemShenLianfeng(沈连丰)WeiHuihai(魏慧海)WanShan(万山)(NationalCommunicationsResearchLaboratory,Departm...  相似文献   

7.
SomeRemarksonStationaryThermistorProblemGuanPing(管平)(DepartmentofMathematicsandMechanics,SoutheastUniversity,Nanjing210018)F...  相似文献   

8.
ResearchonFaultDiagnosticClassifierZhaoLindu1(赵林度)HuaChangchun2(花长春)ShengZhaohan1(盛昭瀚)1(DevelopmentResearchCenterofSystemsand...  相似文献   

9.
1 Introduction Thestochasticdifferentialequations(SDE)areusedinmanyareasofscienceandengineering.ThemainpurposeforsolvingproblemswithSDEistoobtaintheprobabilitydensityfunction(PDF)ofthestatevariablesgovernedbytheSDEbecausemanyotherstatisticalanalysisa…  相似文献   

10.
PancyclicGraphsSatisfyinga3DegreeSumConditionGuGuohua(顾国华)(DepartmentofMathematics,SoutheastUniversity,Nanjing210018)Abstra...  相似文献   

11.
In-SituEpitaxialGrowthofBi-Sr-Ca-Cu-OSuperconductingThinFilmsonSi(100)byrfOf-AxisMagnetronSputeringQianWensheng(钱文生)LiuRong(刘...  相似文献   

12.
Field emission from Si tips coated with nanocrystalline diamond films   总被引:1,自引:0,他引:1  
1. Introduction Recently, carbon nanotubes have attracted a lot of interest because of their outstanding electrical properties and their potential application as a possible material for fabrication of cold cathodes [1-3]. It was found that the field enhancement from carbon nano-tubes exhibited large local field enhancement and considerable field emission currents at relatively low applied voltage. Carbon nanotube-based field emission displays have been fabricated using well-aligned nano-tubes …  相似文献   

13.
采用在石英炉中,氨化Ga2O3薄膜的方法,在Si(111)衬底上成功了制备GaN纳米结构薄膜:纳米线、纳米棒.分别用X射线衍射仪(XRD,Rigaku D/Max--rB Cu Ka)、傅立叶红外透射谱(FTIR,TENSOR27)、扫描电子显微镜(SEM,Hitachi S-570)、高分辨电镜(HRTEM,Philips TECNAIF30)和光致发光谱对样品的结构、成分、形貌和光学特性进行了测量分析.最后,简要的讨论了其生长机制.  相似文献   

14.
用氧等离子体法在低温下已将自合成的聚硅烷涂层成功地转变为二氧化硅薄膜 红外光谱分析表明薄膜的Si-O伸缩振动特征峰为 10 75cm-1,并随处理时间的延长峰位向高波数移动 ,可至 10 88cm-1 光电子能谱测得薄膜中的O1s和Si2p的电子结合能分别为 5 33 0ev和 10 3 8ev ,硅氧原子接近化学计量比 拉曼光谱分析也表明薄膜中含有一个极大的拉曼特征峰  相似文献   

15.
运用溶胶-凝胶(sol-gel)法,在SiO2/Si衬底上制备了BiFeO3薄膜.研究表明,退火温度、退火时间分别为500%、1h的条件下,并且运用XRD及表面扫描电镜(SEM)分析,可制备出纯相的BiFeO3薄膜,R3m点群.  相似文献   

16.
利用磁控溅射的方法在n型硅基底制备了Cu/CoN/Si(100)和Cu/CoSiN/Si(100)薄膜,并对它们进行了不同温度的退火.用原子力显微镜观察了它们的表面形貌.用扫描透射电镜能谱分析法得到了在不同退火温度下铜在上面两种薄膜中浓度与表面距离的分布,然后利用菲克第二定律对Cu/CoN/Si和Cu/CoSiN/Si体系中cu的扩散进行了计算和分析,得出中温条件(300℃-700℃)下Cu在CoN和CoSiN两种薄膜中的扩散系数表达式分别为8.98×10^-13exp(-0.45eV/kT)cHf/s和5.39×10^-11exp(-0.49eV/kT)Cm2/s.  相似文献   

17.
采用磁控溅射方法在Si片沉积了Ti-50.9at%Ni形状记忆合金薄膜,并将薄膜分别在不同温度下进行退火.利用示差扫描量热方法(DSC)、X射线衍射仪(XRD)、透射电镜(TEM)研究了薄膜退火前后形貌、相变特征及应力随退火温度的变化.实验结果表明:溅射态薄膜为非晶态,其晶化温度范围为430℃-535℃,晶化同时伴随着Ti3Ni4相的析出;退火后的薄膜随着退火温度的升高,Rs、Af、Ms均呈上升趋势.薄膜的残余应力随着退火温度的增加而逐渐减少.  相似文献   

18.
采用溶胶凝胶(sol-gel)法,在普通载玻片和Si-SiO2衬底上成功制备Ce掺杂ZnO薄膜.利用X射线衍射仪(XRD)、原子力显微镜(AFM)及光致荧光光谱(PL)对样品的结构、形貌和光学特性进行表征.XRD谱表明大部分样品都有较好的c轴择优取向,而且随着退火温度的升高择优取向明显改善.PL谱中在390nm附近可观察到明显发光峰,退火温度升高能够提高本征发光峰强度,抑制可见光区发光强度.用AFM观察到的样品表面形貌表明,退火温度提高使样品表面更加平整,同时粒径变大.  相似文献   

19.
Pt/Ti bottom electrodes were fabricated on SiO2/Si substrates by magnetron dual-facing-target sputtering system. Lead zirconate titanate(PZT) thin films were deposited on Pt/Ti/ SiO2/Si substrates by radio frequency (RF) magnetron sputtering system. The thickness of PZT thin films which were deposited for 5 h was about 800 nm. XRD spectra show that PZT thin films deposited in Ar ambience and rapid-thermal-annealed for 20 min at 700 ℃ have good crystallization behavior and perovskite structure. AFM micrographs show that mean diameter of crystallites is 70 nm and surface structures of PZT thin films are uniform and dense. Raw mean, root mean square roughness and mean roughness of PZT thin films are 34.357 nm, 2.479 nm and 1.954 nm respectively. As test frequency is 1 kHz, dielectric constant of PZT thin films is 327.6. Electric hysteresis loop shows that coercive field strength, residual polarization strength and spontaneous polarization strength of PZT thin films are 50 kV/cm, 10 μC/cm2 and 13 μC/cm2 respectively.  相似文献   

20.
1 Introduction Becauseofthecombinationofanumberoffavorableproperties,suchashighhardness,highcarriermobilityandbreakdownvoltage,largebandgap ,lowdielectricconstant,andtransparencytovisiblelight,IRlightandmicrowaves,etc.[1] ,diamondfilmhasbeenconsider ablyprom…  相似文献   

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